SpectraStarTM XT-F NIR Analyzer
Optimized NIR Analysis for Flour, Wheat, and By-Products in Milling and Baking
The SpectraStarTM XT-F by KPM Analytics is a comprehensive NIR analyzer package designed for the rapid and precise analysis of wheat, flour, and by-products. Ideal for millers and bakers, this advanced analyzer combines proven technology with ready-to-use calibrations, enabling accurate insights into quality parameters such as moisture, protein, ash, and water absorption.
Key Features :
- Advanced NIR Technology : Equipped with a high-performance scanning monochromator for unparalleled accuracy in analyzing key parameters like moisture, protein, ash, and water absorption.
- Extensive Calibration Library : Comes pre-loaded with tailored calibrations for whole wheat kernels, ground wheat, flour, and milling by-products, ensuring precise monitoring across every stage of the milling and baking process.
- Durable & Dustproof Design : Built with a sealed aluminum case, ideal for dusty environments such as flour mills and raw material receiving areas, ensuring consistent performance in challenging conditions.
- Intuitive Operation : Features a touchscreen interface powered by UScanTM software, providing a user-friendly experience with minimal training requirements.
- Plug-and-Play Setup : Easily integrates into existing workflows with its standalone design, suitable for both laboratory and at-line applications.
- Remote Connectivity : Compatible with KPMLink for cloud-based monitoring, enabling calibration updates and seamless standardization across multiple sites.
Applications Across Industries :
- Milling Industry – Analyze wheat quality, monitor tempering, optimize extraction, and maintain consistent flour production.
- Baking & Food Production – Validate flour quality, optimize water absorption, and ensure uniform dough performance.
- Agriculture & Grain Storage – Assess whole wheat kernels and by-products, ensuring optimal storage and reduced waste.
- Quality Control & Research – Achieve fast, operator-independent NIR analysis for compliance and process optimization.
